, D. N. S. “Comparative Electrical Characterization of SnTe Thin Films Grown by Thermal Evaporation and RTA Techniques”. International Journal on Future Revolution in Computer Science &Amp; Communication Engineering, vol. 4, no. 1, Jan. 2018, pp. 130-4, http://ijfrcsce.org/index.php/ijfrcsce/article/view/979.