, D. N. S. Growth and Structural Characterization of Semiconducting Tin Telluride Thin Films by Novel Rapid Thermal Annealing Technique. International Journal on Future Revolution in Computer Science & Communication Engineering, [S. l.], v. 4, n. 1, p. 01–04, 2018. Disponível em: http://ijfrcsce.org/index.php/ijfrcsce/article/view/954. Acesso em: 2 may. 2024.